Scan compression reduces the amount of data needed for digital IC manufacturing tests, thereby lowering the cost of executing patterns on the tester. EDA solutions for implementing scan compression on ...

About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.

Test compression technology was invented to address the problem of escalating test-pattern size. Compression allows more test vectors to be applied to an IC in a shorter time and with fewer tester ...